Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution - Tsong, Tien T. (Pennsylvania State University) - Bøger - Cambridge University Press - 9780521019934 - 15. september 2005
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Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

Tsong, Tien T. (Pennsylvania State University)

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Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.

400 pages, black & white illustrations

Medie Bøger     Paperback Bog   (Bog med blødt omslag og limet ryg)
Udgivet 15. september 2005
ISBN13 9780521019934
Forlag Cambridge University Press
Antal sider 400
Mål 157 × 234 × 22 mm   ·   556 g
Sprog Engelsk  

Se alt med Tsong, Tien T. (Pennsylvania State University) ( f.eks. Paperback Bog )