Scanning Electron Microscopy and X Ray Microanalysis 3rd ed. 2003. Softcover reprint of the original 3r edition

Joseph Goldstein

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Scanning Electron Microscopy and X Ray Microanalysis 3rd ed. 2003. Softcover reprint of the original 3r edition

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

709 pages, biography